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In-Situ Neutron Reflectometry during Thin Film Growth by Sputter Deposition
In-Situ Neutron Reflectometry during Thin Film Growth by Sputter Deposition
2014
Wolfgang Kreuzpaintner
Thomas Mairoser
Jochen Mannhart
K. Panagiotis
P. Böni
Alexander Herrnberger
J. Stahn
A. Schmehl
Jingfan Ye
Matthias Pomm
Birgit Wiedemann
Martin Haese
Amitesh Paul
Sina Mayr
Jean-François Moulin
Keywords:
Sputter deposition
Thin film
Neutron reflectometry
Analytical chemistry
Materials science
Optoelectronics
Impulse (physics)
In situ
Correction
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