Old Web
English
Sign In
Acemap
>
Paper
>
Layer contour characterization in additive manufacturing through image binarization
Layer contour characterization in additive manufacturing through image binarization
2021
D. Blanco
A. Fernandez
P. Fernandez
B. J. Álvarez
F. Peña
Keywords:
Artificial intelligence
Computer vision
Materials science
characterization
layer
Image (mathematics)
Correction
Source
Cite
Save
Machine Reading By IdeaReader
6
References
0
Citations
NaN
KQI
[]