Mitigating single event upset method for Zynq MPSoC

Abstract Single event upset (SEU) have direct influence on the reliability of Zynq Multi-Processor System-on-Chip (MPSoC). To mitigate SEU, the method based on the structural features of the two ARM cores in Zynq is proposed. Dual-core mutual detection and rollback recovery are utilized to detect and repair the errors caused by SEU. Hsiao code is also integrated to enhance the SEU-resistance of on-chip memory. Experimental results show that the proposed method can correct error of ARMs and on-chip memory error.