Rigorous Coupled Wave Analysis of GaAs Thermophotovoltaic Devices with a Patterned Dielectric Back Contact
2021
In principle, a patterned dielectric back contact structure in a GaAs thermophotovoltaic device boosts the sub-bandgap reflectance. Rigorous coupled wave analysis method is used to study the three dimensional (3D) periodic grating effects of metal point contact diameter and spacing on sub-bandgap reflectance of the device.
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