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Direct observation of site-specific dopant substitution in Si doped (Al x Ga1− x )2O3 via atom probe tomography
Direct observation of site-specific dopant substitution in Si doped (Al x Ga1− x )2O3 via atom probe tomography
2021
Jith Sarker
A F M Anhar Uddin Bhuiyan
Zixuan Feng
Hongping Zhao
Baishakhi Mazumder
Keywords:
Crystallography
Materials science
Atom probe
si doped
Dopant
direct observation
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