Spectral characteristics of the x-ray sensitivity of A/sup III/B/sup VI/ and A/sup III/B/sup III/X/sub 2//sup VI/ semiconductors

The spectral distribution of the sensitivity and the choice of the optimal thickness of single crystals of layered semiconductors of the types A/sup III/B/sup IV/ and A/sup III/b/sup III/X/sub 2//sup VI/ in the range of x radiation 0.1-1.5 A was studied theoretically. It was established that thin samples of all compounds have maximum sensitivity near the wavelength 0.28 A, which shifts toward short waves as the thickness of the sample increases. Jumps were observed in the sensitivity in the region of the K absorption edge of the components of the compounds. The intervals of optimal thicknesses of each compound for the entire spectral range studied are presented.