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Characterization of Novel Nanoscale Device Architectures using Current Mapping AFM.
Characterization of Novel Nanoscale Device Architectures using Current Mapping AFM.
2015
Stephen Wayne Howell
Matthew Marinella
Michael P. Siegal
Caitlin Anne Rochford Friedman
Seth Decker
David Russell Hughart
William Graham Yelton
Thomas E. Beechem
Paul Davids
Gregory R. Bogart
Shawn M. Dirk
Keywords:
Nanotechnology
Nanoscopic scale
Atomic force microscopy
Materials science
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