Old Web
English
Sign In
Acemap
>
Paper
>
Characterization of NiO/YSZ Electrode by Temperature-Programmed Reduction
Characterization of NiO/YSZ Electrode by Temperature-Programmed Reduction
1993
Toshiyuki Shirakawa
Keywords:
Non-blocking I/O
Yttria-stabilized zirconia
Chemical engineering
Electrode
Temperature-programmed reduction
Materials science
Correction
Source
Cite
Save
Machine Reading By IdeaReader
0
References
0
Citations
NaN
KQI
[]