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Step-stress Reliability Studies on AlGaN/GaN HEMTs on Silicon with Buffer Thickness Dependence
Step-stress Reliability Studies on AlGaN/GaN HEMTs on Silicon with Buffer Thickness Dependence
2012
Amalraj,Frank,Wilson
Wakejima Akio
Egawa Takashi
Keywords:
Analytical chemistry
Silicon
Materials science
algan gan
Optoelectronics
step stress
Correction
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