Recording of Kossel patterns using monochromatic synchrotron radiation

Abstract First results of Kossel measurements using monochromatic synchrotron radiation at the beam line F1 at the synchrotron source HASYLAB/DESY are presented. Methodical aspects of the application of the Kossel technique to specimens sensitive to particle irradiation or covered by layers were surveyed. Furthermore the influence of the selective excitation of characteristic radiation on the background reduction in the case of compound crystals was investigated. Both the excitation of Kossel interferences of a glass covered cuprite sample and an irradiation sensitive synthetic chalcanthite crystal as well as the selective excitation of Ga Kα radiation of a GaAs single crystal were demonstrated. In all cases Kossel photographs rich in contrast could be obtained.