Quantifying crystalline texture with a tabletop energy and angle dispersive diffractometer for material identification (Conference Presentation)
2020
Polychromatic X-ray scatter is modulated in both angle and energy in a way that encodes a material’s crystalline texture. Various texture quantification metrics have been calculated from X-ray scatter which are typically most informative for fundamental material or crystallographic research. In this work, we quantify material crystalline texture from scatter measurements made using a tabletop energy and angle dispersive diffractometer and show that these X-ray scatter-based metrics have promise as complementary metrics to the material form factor and are particularly suited for material identification applications.
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