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Morphological Characterization of Polysilicon Films Laser-Annealed in Argon Ambient
Morphological Characterization of Polysilicon Films Laser-Annealed in Argon Ambient
2001
Y. Helen
G. Gautier
K. Mourgues
F. Raoult
Tayeb Mohammed-Brahim
Régis Rogel
Olivier Bonnaud
C. Prat
D. Lemoine
Keywords:
Annealing (metallurgy)
Composite material
Laser
Metallurgy
Materials science
Argon
excimer laser crystallization
Correction
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