Electric field effects on force curves for oxidized silicon tips and ice surfaces in a controlled environment

A scanning force microscope and environmental chamber are described for use in studying the surface properties of ice that is grown from vapor. This microscope uses a modulated optical deflection scheme to minimize low frequency noise, and a thermal feedback system which can stabilize the ice temperature to within 0.4 mK. The ice crystal can be examined in its own vapor plus other controlled gaseous environments. Initial results show that, in the range of −8 to −10 °C and negative tip voltages, necks form between the oxidized silicon tip and the ice sample after contact with the surface.