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Imaging thick objects in optical scanning microscopy: penetrable surfacesand patterned-layer structures
Imaging thick objects in optical scanning microscopy: penetrable surfacesand patterned-layer structures
2002
J. F. Aguilar
E. R. Me´ndez
A. A. Maradudin
Keywords:
Scanning confocal electron microscopy
Scanning ion-conductance microscopy
Optics
Physics
Microscopy
Image processing
Optoelectronics
Polarization (waves)
Refractive index
Scattering
optical scanning
Correction
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