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Experimental and microscopic analysis of 600V GaN-GIT under the short-circuit aging tests
Experimental and microscopic analysis of 600V GaN-GIT under the short-circuit aging tests
2019
Pascal Dherbecourt
Moncef Kadi
Jian zhi Fu
F. Fouquet
Fabien Cuvilly
Keywords:
Materials science
Short circuit
Optoelectronics
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