Convolutional neural networks for grazing incidence x-ray scattering patterns: thin film structure identification

Shuai Liu,Charles Melton,Singanallur V. Venkatakrishnan,Ronald Pandolfi,Guillaume Freychet,Dinesh Kumar,Haoran Tang,Alexander Hexemer,Daniela Ushizima

Convolutional neural networks for grazing incidence x-ray scattering patterns: thin film structure identification

2019

Shuai Liu
Charles Melton
Singanallur V. Venkatakrishnan
Ronald Pandolfi
Guillaume Freychet
Dinesh Kumar
Haoran Tang
Alexander Hexemer
Daniela Ushizima

Author(s): Liu, Shuai; Melton, Charles N; Venkatakrishnan, Singanallur; Pandolfi, Ronald J; Freychet, Guillaume; Kumar, Dinesh; Tang, Haoran; Hexemer, Alexander; Ushizima, Daniela M | Abstract: Abstract

Keywords:

Materials science
Thin film
Composite material
Convolutional neural network
Optoelectronics
Scattering
X-ray
Waveguide
Robustness (computer science)
Piezoelectricity
Nanoparticle

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