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Raman Spectroscopy Characterization of Ion Implanted 4H-SiC
Raman Spectroscopy Characterization of Ion Implanted 4H-SiC
2019
Zongwei Xu
Ying Song
Mathias Rommel
Tao Liu
Matthias Kocher
Zhongdu He
Hong Wang
B.T. Yao
Lei Liu
Fengzhou Fang
Keywords:
Raman spectroscopy
Ion implantation
Composite material
Ion
Analytical chemistry
Materials science
Semiconductor
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