Analysis of microhardness data in TlxIn1−xSe

Microhardness measurements have been performed on TlxIn1−xSe semiconductors (x=0.0, 0.2, 0.3 ... 1.0). The microhardness, H, as a function of x shows a maximum at x ca. 0.5. A statistical evaluation of the obtained results leads to a log-normal distribution of the microhardness rather than, as expected, a polynomial one.