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A comparative study of the TID radiation effects on ASICs manufactured in 180 nm commercial technologies
A comparative study of the TID radiation effects on ASICs manufactured in 180 nm commercial technologies
2018
M. Marcisovska
T. Benka
M. Havranek
M. Hejtmanek
Z. Janoska
V. Kafka
M. Marčišovský
G. Neue
J. Popule
P. Svihra
L. Tomasek
P Vancura
Vaclav Vrba
Keywords:
Physics
Optics
Radiation
Electronic engineering
Optoelectronics
Correction
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