Optical metrology devices for high-power laser large optics
2007
High power laser systems such as the LMJ laser or the LIL laser, its prototype, require large optical components with
very strict and various specifications. Technologies used for the fabrication of these components are now usually
compatible of such specifications, but need the implementation at the providers' sites of different kind of metrology like
interferometry, photometry, surface inspection, etc., systematically performed on the components. So, during the
production for the LIL and now for the LMJ, CEA has also equipped itself with a wide range of specific metrology
devices used to verify the effective quality of these large optics. These various systems are now used to characterize and
validate the LMJ vendors' processes or to perform specific controls dedicated to analyzes which are going further than
the simple "quality control" of the component (mechanical mount effect, environment effect, ageing effect,...).
After a short introduction on the LMJ laser and corresponding optical specifications for components, we will focus on
different metrology devices concerning interferometry and photometry measurements or surface inspection. These
systems are individually illustrated here by the mean of different results obtained during controls done in the last few
years.
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