Study of Film Structure on a Commutator Formed by Brushes of Niobium-Diselenide-Graphite Composition,

V. L. Kalikhman,A. G. Duksina,V. S. Titov,E. B. Granovskii

Study of Film Structure on a Commutator Formed by Brushes of Niobium-Diselenide-Graphite Composition,

1974

V. L. Kalikhman
A. G. Duksina
V. S. Titov
E. B. Granovskii

Abstract : Methods of electron microscopy and microdiffraction are used to study a film of polish formed on a short-circuited M-1 copper commutator by brushes of niobium-diselenide-graphite composition. (Author)

Keywords:

Commutator (electric)
Copper
Graphite
Crystallography
Electron diffraction
Electron microscope
Diselenide
Materials science
Niobium
film structure

Correction
Cite
Save
Machine Reading By IdeaReader

References

Citations