Old Web
English
Sign In
Acemap
>
Paper
>
Rapid thermal process-induced defects in silicon position detectors
Rapid thermal process-induced defects in silicon position detectors
1994
M. Alietti
F. Nava
R. Tonini
P. Cantoni
L. Stagni
A. Cavallini
Keywords:
Thermal
Nuclear magnetic resonance
Detector
Silicon
Rapid thermal processing
Physics
Optics
Correction
Source
Cite
Save
Machine Reading By IdeaReader
32
References
3
Citations
NaN
KQI
[]