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Yield Coefficient for Surface Penning Ionization
Yield Coefficient for Surface Penning Ionization
2000
George Henry Rutherford
M. J. Asbury
Richard A. Davis
Laura Ingram
G. G. Shepard
Riccardo Enrico Zich
Keywords:
Atomic physics
Dynamic Monte Carlo method
Monte Carlo method
Penning ionization
Chemistry
Charged particle
Correction
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