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Detection of Flaws on Melamine Faced Chipboards using Wavelet-based Texture Analysis
Detection of Flaws on Melamine Faced Chipboards using Wavelet-based Texture Analysis
2001
Regine Bölter
Gunther Lenz
Gustavo Fernández Domínguez
Franz Leberl
Keywords:
Wavelet
Pattern recognition
Artificial intelligence
Computer science
Melamine
Correction
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