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Sensitivity Degradation of the ISUAL instruments and its impact to the observations
Sensitivity Degradation of the ISUAL instruments and its impact to the observations
2009
Alfred B. C. Chen
C.C.Chiang
Yuan-shin Hwang
Ying Wu
C. C. Kuo
R.-R. Hsu
H. T. Tzong Su
Stephen Lin
Tie-Yue Liu
Stephen B. Mende
Harald U. Frey
Yu Takahashi
Lauren Lee
Keywords:
High voltage
Electronic engineering
Electrical engineering
Microchannel plate detector
Engineering
Correction
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