Chemical and Ionic Conductivity Degradation of Ultra-Thin Ionomer Film by X-ray Beam Exposure

X-ray based techniques have been adopted as a diagnostic tool for both ex-situ and in-situ material characterization techniquesin PEMFC. Possible damage of Nafion due to X-ray irradiation is a concern especially for thin films. To investigate the X-rayirradiation effect on ultra-thin Nafion film structure and properties, supported 10 nm films were prepared on SiO