Method for testing ram array

PROBLEM TO BE SOLVED: To shorten the time required for discriminating a defective semiconductor memory chip. SOLUTION: A method for testing RAM array includes a step in which an array selecting signal is given, a step in which a row group in an array is selected, a step in which at least one row is selected out of a selected row group, and a step in which the steps (b) and (c) are repeated until all row groups are selected. An array sense amplifier 140 is set when the first row group is selected and kept set until the last row group is selected. In the first test, the word lines 112 and 118 of all selected rows are activated and kept activated until the last selected row is selected. In the second test, the word lines of the selected groups are toggled by means of an RAS. When a group contains a known defective word line, the group is not addressed or the selection of the word line is disabled. COPYRIGHT: (C)1996,JPO