Structural evolution during lithiation of sputtered V2O5 films

Li x VO2.5 films were made by reactive dc magnetron sputtering followed by galvanostatic treatment in LiClO4. Structural evolution forx increasing from zero to ≈ 1, studied by X-ray diffraction, was consistent with a VO5-based layer configuration with progressively increasing layer separation and puckering. Two-phase behavior was found forx>1.