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Semiconductor measurement technology: Method to determine the quality of sapphire
Semiconductor measurement technology: Method to determine the quality of sapphire
1980
M. T. Duffy
P. J. Zanzucchi
W. E. Ham
J. F. Corbov
G.W. Cullen
Keywords:
Materials science
Sapphire
Solid-state physics
Semiconductor
Crystal structure
Light scattering
Threshold voltage
Silicon
Reflectivity
Optoelectronics
Correction
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