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Conductivity of single ZnO nanorods after Ga-implantation in a focused-ion-beam system
Conductivity of single ZnO nanorods after Ga-implantation in a focused-ion-beam system
2008
D. Weissenberger
Michael Duerrschnabel
Dagmar Gerthsen
Fabián Pérez-Willard
A. Reiser
G. M. Prinz
Martin Feneberg
Klaus Thonke
Rolf Sauer
Keywords:
Electron mobility
Ion implantation
Crystallographic defect
Conductivity
Optoelectronics
Transmission electron microscopy
Materials science
Focused ion beam
Nanorod
Microscopy
Correction
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