Analysis ofD0→KK¯Xdecays

Using data taken with the CLEO II detector, we have studied the decays of the ${D}^{0}$ to ${K}^{+}{K}^{\ensuremath{-}}$, ${K}^{0}{\overline{K}}^{0}$, ${K}_{S}^{0}{K}_{S}^{0}{K}_{S}^{0}$, ${K}_{S}^{0}{K}_{S}^{0}{\ensuremath{\pi}}^{0}$, ${K}^{+}{K}^{\ensuremath{-}}{\ensuremath{\pi}}^{0}$. We present significantly improved results for $B({D}^{0}\ensuremath{\rightarrow}{K}^{+}{K}^{\ensuremath{-}})=(0.454\ifmmode\pm\else\textpm\fi{}0.028\ifmmode\pm\else\textpm\fi{}0.035)%$, $B({D}^{0}\ensuremath{\rightarrow}{K}^{0}{\overline{K}}^{0})=(0.054\ifmmode\pm\else\textpm\fi{}0.012\ifmmode\pm\else\textpm\fi{}0.010)%$, and $B({D}^{0}\ensuremath{\rightarrow}{K}_{S}^{0}{K}_{S}^{0}{K}_{S}^{0})=(0.074\ifmmode\pm\else\textpm\fi{}0.010\ifmmode\pm\else\textpm\fi{}0.015)%$, where the first errors are statistical and the second errors are the estimate of our systematic uncertainty. We also present a new upper limit $B({D}^{0}\ensuremath{\rightarrow}{K}_{S}^{0}{K}_{S}^{0}{\ensuremath{\pi}}^{0})l0.059%$ at the 90% confidence level and the first measurement of $B({D}^{0}\ensuremath{\rightarrow}{K}^{+}{K}^{\ensuremath{-}}{\ensuremath{\pi}}^{0})=(0.14\ifmmode\pm\else\textpm\fi{}0.04)%$.