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Thin-Film Transistor Simulations with the Voltage-In-Current Latency Insertion Method
Thin-Film Transistor Simulations with the Voltage-In-Current Latency Insertion Method
2021
Wei-Chun Chin
Andrei Pashkovich
Jose E. Schutt-Aine
Nur Syazreen Ahmad
Patrick Goh
Keywords:
Optoelectronics
Voltage
Current (fluid)
Materials science
Latency (engineering)
Thin-film transistor
Correction
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