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High resolution >40 keV x-ray radiography using an edge-on micro-flag backlighter at NIF-ARC
High resolution >40 keV x-ray radiography using an edge-on micro-flag backlighter at NIF-ARC
2020
Matthew Hill
Alex Zylstra
Camelia V. Stan
Tom Lockard
E. T. Gumbrell
R.E. Rudd
Philip A. Powell
Damian Swift
James McNaney
Hye-Sook Park
Keywords:
Arc (geometry)
Edge (geometry)
x ray radiography
Optics
Materials science
flag
high resolution
Correction
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