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Spatial accuracy of 70 x 75 mm**2 silicon drift detectors accounting for dopant concentration fluctuations
Spatial accuracy of 70 x 75 mm**2 silicon drift detectors accounting for dopant concentration fluctuations
2000
V. Bonvicini
A. Rashevsky
A. R. Hernandez-Montoya
E. Crescio
F. Tosello
Luis M. Montaño
D. Nouais
P.Cerello
C. Piemonte
A. Vacchi
A. Kolojvari
P. Giubellino
R. Wheadon
Keywords:
Optoelectronics
Detector
Dopant
Materials science
Silicon
Correction
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