Statistical Study of Coupling in Randomly Distributed Dipole Sets

A statistical analysis of the coupling in a set of thin randomly distributed dipoles is presented. The impedance matrix of the set is obtained using the IEMF technique and validated by NEC. The input impedance of each surrounded dipole can be calculated for any arbitrary loading of the surrounding dipoles. The cumulative distributed functions are presented for different dipole densities and the mismatch of a surrounded dipole is studied as a function of the surrounding loading.