Magnetization imaging at high spatial resolution using transmission electron microscopy

A new method of imaging has been developed for mapping the distribution of magnetic induction in thin films in a conventional transmission electron microscope. The method produces differential phase contrast images at high spatial resolution without using expensive additional equipment. The capabilities of our method are demonstrated by the measurement of domain wall width in a NdFeB alloy specimen, and by the determination of the two‐dimensional magnetic induction distribution in a Co/Cr/Co trilayer.