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A Test Generation Method for Resistive Open Faults Using MAX-SAT Problem
A Test Generation Method for Resistive Open Faults Using MAX-SAT Problem
2019
Yamazaki Hiroshi
Hosokawa Toshinori
Yoshimura Masayoshi
Arai Masayuki
Yotsuyanagi Hiroyuki
Hashizume Masaki
Keywords:
Algorithm
Resistive touchscreen
Maximum satisfiability problem
Mathematics
Correction
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