Dual-wavelength in-line phase-shifting interferometry based on two dc-term-suppressed intensities with a special phase shift for quantitative phase extraction.

To efficiently promote the phase retrieval in quantitative phase imaging, a new approach of quantitative phase extraction is proposed based on two intensities with dual wavelength after filtering the corresponding dc terms for each wavelength, in which a special phase shift is used. In this approach, only the combination of the phase-shifting technique and subtraction procedures is needed, and no additional algorithms are required. The thickness of the phase object can be achieved from the phase image, which is related to the synthetic beat wavelength. The feasibility of this method is verified by the simulated experiments of the optically transparent objects.