ICP-AES Method for the Determination of Impurities in High Purity Tellurium

An ICP-AES method for the determination of impurities in high purity Te was reported. The sample was dissolved with aqua regia and then determined by ICP spectrometry. The selected analytical lines had been examined via individual wavelength scanning with coexisted elements for avoidance of spectral interferences. It was found that the Pb line at 182.203 nm is subjected to the overlapping interference of the wing of the Te line at 182.2 nm. The detection limits(DL, in terms of 3σ), determination limits(in terms of 5DL or 15σ), precision and recovery all meet the requirements of analysis of high purity Te, except S.