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A Novel TEM/AFM/STM Microscopy for Cu Nano-Wire Electromigration
A Novel TEM/AFM/STM Microscopy for Cu Nano-Wire Electromigration
2002
Satoru Fujisawa
Takamaro Kikkawa
Tokushi Kizuka
Keywords:
Electromigration
Nanowire
Crystallography
Atomic force microscopy
Microscopy
Materials science
Nanotechnology
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