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Transition layer thickness of thin magnetic films determined by X-ray Resonant Magnetic Scattering (XRMS)
Transition layer thickness of thin magnetic films determined by X-ray Resonant Magnetic Scattering (XRMS)
2002
John Kelly
Bryan Barnes
Doug P. Lagally
Mark Friesen
Donald E. Savage
Max G. Lagally
Keywords:
transition layer
magnetic films
Condensed matter physics
Scattering
X-ray
Materials science
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