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Comprehensive analysis of the impact of boron and oxygen on the metastable defect in Cz silicon
Comprehensive analysis of the impact of boron and oxygen on the metastable defect in Cz silicon
2003
Bothe
Schmidt
Hezel
Keywords:
Open-circuit voltage
Silicon
Metastability
cz silicon
Oxygen
Carrier lifetime
Analytical chemistry
degradation process
Boron
Materials science
Correction
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