Hydrogenation and X-ray diffraction study of microstresses in Pd alloys
1995
Abstract X-ray diffraction profiles from different concentrations of Pd, PdPt, PdCu, PdSm, PdRu and PdHf alloys have been recorded for cold-worked, annealed and hydrogenated states. Using the peak shift, the relationship between the values of microstresses and the concentrations of added elements as well as the values of r Pd r ad have been observed.
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