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X-ray phase scanner using Talbot-Lau interferometry for non-destructive testing – III
X-ray phase scanner using Talbot-Lau interferometry for non-destructive testing – III
2016
Shivaji Bachche
Masahiro Nonoguchi
Koichi Kato
Masashi Kageyama
Takafumi Koike
Masaru Kuribayashi
Atsushi Momose
Keywords:
Scanner
X-ray
Phase contrast microscopy
Interferometry
Nondestructive testing
Optics
Physics
Correction
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