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Determination of the composition of ion-implanted MgO surface layers by Rutherford and resonant backscattering of ions
Determination of the composition of ion-implanted MgO surface layers by Rutherford and resonant backscattering of ions
1996
V. M. Zavodchikov
A.P. Kobzev
Yu. Yu. Kryuchkov
V. F. Pichugin
V. V. Sokhoreva
T. S. Frangul’yan
Keywords:
Ion
Materials science
Backscatter
Analytical chemistry
Correction
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