Microwave and terahertz dielectric properties of single-crystalline scandate substrates for ferroic thin film deposition

Single-crystalline (110) DyScO 3 and (110) TbScO 3 substrates were studied in microwave and THz ranges. Their inplane components of anisotropic dielectric parameters were measured from 10 K to 400 K. TE 01d and HE 11d resonances of the thin substrates were used for their microwave characterization. The microwave and THz parameters are consistent, show a strong dielectric anisotropy and pronounced temperature dependences. Use of the substrates in microwave applications is discussed.