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A new dynamic-bias measurement setup for nonlinear transistor model identification
A new dynamic-bias measurement setup for nonlinear transistor model identification
2017
Valeria Vadala
Antonio Raffo
Gustavo Avolio
Mauro Marchetti
Dominique Schreurs
Giorgio Vannini
Keywords:
Transistor model
Electronic engineering
Mathematics
Control engineering
Nonlinear system
frequency dispersion
System of measurement
Electrical engineering
Correction
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