Old Web
English
Sign In
Acemap
>
Paper
>
Piezoelectric Properties of Self-Polarized Pb(ZrxTi1-x)O3 Thin Films Probed by Scanning Force Microscopy
Piezoelectric Properties of Self-Polarized Pb(ZrxTi1-x)O3 Thin Films Probed by Scanning Force Microscopy
2005
V. V. Shvartsman
A. V. Pankrashkin
V. P. Afanasjev
E. Yu. Kaptelov
I. P. Pronin
A. L. Kholkin
Keywords:
Optoelectronics
Conductive atomic force microscopy
Atomic force acoustic microscopy
Thin film
Scanning probe microscopy
Analytical chemistry
Scanning confocal electron microscopy
Chemistry
Scanning ion-conductance microscopy
Photoconductive atomic force microscopy
Scanning capacitance microscopy
Correction
Cite
Save
Machine Reading By IdeaReader
0
References
3
Citations
NaN
KQI
[]