Old Web
English
Sign In
Acemap
>
Paper
>
ESD robust DeMOS devices in advanced CMOS technologies
ESD robust DeMOS devices in advanced CMOS technologies
2011
Shrivastava
russ
Gossner
Bychikhin
Pogany
Gornik
Keywords:
Temperature measurement
Electric field
Current density
CMOS
Logic gate
Electrical engineering
Solid modeling
Computer science
Correction
Source
Cite
Save
Machine Reading By IdeaReader
0
References
16
Citations
NaN
KQI
[]