Applying angle resolved EXAFS spectroscopy to the study of layers and interfaces in metallic multilayer nanoheterostructures

A new technique is proposed for determining concentration profiles and local atomic structure at various depths in metallic multilayer films, using the dependence of the EXAFS spectra on the angle of incidence. The abilities of this technique are demonstrated via modelling calculations for the three-layered Cr/Fe/Cr system. The first experimental results for thin Cr films on sapphire substrates are obtained.